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Custom Batch-Specific Analyses
We understand that some clients may have unique regulatory, technical, or application-specific requirements for their materials. To address these needs, we offer custom batch-specific analyses performed by third-party laboratories from our network of trusted partners. These analyses ensure impartiality and reliable results.
Available Analyses
The following analyses are available upon request:
- APS: Mean particle size analysis on 100 particles by SEM after ultrasonication.
- DLS: Dynamic Light Scattering for hydrodynamic particle size measurement in suspension.
- EDX: Elemental analysis via Energy Dispersive X-ray Spectroscopy.
- FTIR: Fourier Transform Infrared Spectroscopy for molecular and bonding analysis.
- ICP-OES: Impurity level analysis at the ppm level.
- ICP-MS: Impurity level analysis at the ppb level.
- PSD: Primary particle size distribution on 500 particles by SEM after high-shear mixing and ultrasonication.
- Raman: Raman Spectroscopy for structural and molecular characterization.
- SEM: Scanning Electron Microscopy for particle characterization.
- SSA: Specific surface area analysis using BET method.
- TEM: Transmission Electron Microscopy for high-resolution particle imaging.
- VSM: Magnetic characterization via Vibrating Sample Magnetometry.
- XRD: Crystallinity and phase composition analysis via X-ray Diffraction.
- Other Specific Analyses: Available upon request based on client needs.
Service Details
- Trusted Partners: All analyses are conducted by independent laboratories to ensure impartiality and accuracy.
- Custom Solutions: We tailor analyses to meet your specific requirements.
- Pricing: Pricing varies based on the type of analysis and the client’s specific scenario. Please contact us for more details.
Contact Us
If you are interested in custom batch-specific analyses or need more information, please contact us. Our team will provide you with details about available options, pricing, and lead times.